Characterization of Materials by E. Lifshin (editor)

By E. Lifshin (editor)

Fabrics technology and know-how is a seminal paintings and crucial reference delivering entry to a veritable compendium of knowledge protecting an important periods of fabrics present in undefined, together with: metals, ceramics, glasses, polymers, semiconductors and composites. also, fabrics technology and expertise offers with the purposes, processing, and primary rules linked to those fabrics. It truly and comprehensively presents the consumer with facts from learn and at the homes, guidance and capability of the person sessions of fabrics.

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It not only depends on the path length as "normal" absorption does. Phenomenologically, it can be described in a way similar to that in the description of normal absorption, by assuming a complex lattice potential: h2K2)/(2rne) V(r) + iW(r) = (1-104) whereas the magnitude of the wave vector K in the crystal becomes h2K2/(2me) = (1-105) The boundary condition at the entrance face requires continuity of the tangential components Ko t = Kt; this leads to refraction (Fig. 1-8) by the constant part of the potential Vo.

Many sections of reciprocal space will look similar in the two cases. In order to differentiate the two cases, tilting experiments around two different rotation axes are required to make sure that an unsplit plane exists. Such an experiment is represented in Fig. 1-36 for the case of MoTe 2 . Special cases arise if the two domains have a common lattice, but differently oriented structures. Such a situation may occur if the symmetry of the structure is lower than that of the lattice; it exists for instance in 8-NiMo where the Bravais lattice is tetragonal, but the structure has a non-centrosymmetrical orthorhombic structure (Van Tendeloo and Amelinckx, 1973).

A schematic profile, as well as an observed pattern, is given for the two types of fringes. ) fringe pattern is symmetrical with respect to the foil center (u = 0). ) pattern is antisymmetrical with respect to the foil center. F. F. patterns are similar but close to the exit face they are complementary. This is in fact a general feature of diffraction contrast images of defects in thick foils; it is also particularly true for dislocation images. (v) With increasing thickness, new fringes are created in the center close to u = 0.

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