Atomic Force Microscopy in Process Engineering. Introduction by W. Richard Bowen

By W. Richard Bowen

This is the 1st ebook to assemble either the elemental thought and confirmed procedure engineering perform of AFM. it truly is offered in a fashion that's available and worthwhile to practicing engineers in addition to to those that are enhancing their AFM abilities and data, and to researchers who're constructing new items and recommendations utilizing AFM.

The booklet takes a rigorous and sensible process that guarantees it's without delay acceptable to method engineering difficulties. basics and methods are concisely defined, whereas particular advantages for approach engineering are in actual fact outlined and illustrated. Key content material comprises: particle-particle, and particle-bubble interactions; characterization of membrane surfaces; the advance of fouling resistant membranes; nanoscale pharmaceutical research; nanoengineering for mobile sensing; polymers on surfaces; micro and nanoscale rheometry.

  • Atomic strength microscopy (AFM) is a crucial instrument for strategy engineers and scientists because it allows superior methods and products
  • The purely e-book facing the speculation and sensible functions of atomic strength microscopy in strategy engineering
  • Provides best-practice suggestions and adventure on utilizing AFM for procedure and product improvement

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Extra resources for Atomic Force Microscopy in Process Engineering. Introduction to AFM for Improved Processes and Products

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Where 01 and 02 are the electronic polarisabilities of the two molecules. Both the Keesom and the Debye interactions involve polar molecules and are thus not always present, depending upon the molecules involved in the interaction. However, the dispersive, or London, component of the interaction described by London during the 1930s is always present. As two molecules come into close proximity, the repulsion between the negative charges in the electron shells causes the induction of temporary dipoles.

One part of this double layer is formed by the charge of the surface of the particles. Another part of the electrical double layer is formed by the excess of oppositely charged ions in the solution. As a result of their thermal motion, the electrical charge carried by this layer extends over a certain distance from the particle surface and dies out gradually with increasing distance (diffuse layer) into the bulk liquid phase. 2 D  istribution of Electrical Charge and Potential in the Double Layer The first approximate theory for the electrical double layer was given by Gouy, Chapman, Debye and Hückel [24].

102] L. Hutter, J. Bechhoefer, Calibration of atomic force microscope tips, Rev. Sci. Instrum. 64 (7) (1993) 1868–1873. [103] R. Levy, M. Maaloum, Measuring the spring constant of atomic force microscope cantilevers: thermal fluctuations and other methods, Nanotechnology 13 (2002) 33–37. -J. Butt, M. Jaschke, Calculation of thermal noise in atomic force microscopy, Nanotechnology 6 (1995) 1–7. L. Hutter, Comment on tilt of atomic force microscope cantilevers: effect on spring constant and adhesion measurements, Langmuir 21 (2005) 2630–2632.

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