By Bharat Bhushan, Harald Fuchs
The volumes XI, XII and XIII learn the actual and technical origin for contemporary development in utilized scanning probe thoughts. the 1st quantity got here out in January 2004, the second one to fourth volumes in early 2006 and the 5th to 7th volumes in past due 2006. the sector is progressing so quickly that there's a want for a collection of volumes each 12 to 18 months to catch most modern advancements. those volumes represent a well timed finished evaluation of SPM purposes. After introducing scanning probe microscopy, together with sensor know-how and tip characterization, chapters on use in numerous business purposes are provided. commercial purposes span topographic and dynamical floor reports of thin-film semiconductors, polymers, paper, ceramics, and magnetic and organic fabrics. The chapters were written via prime researchers and alertness scientists from world wide and from a number of industries to supply a broader viewpoint.
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Extra info for Applied Scanning Probe Methods XII: Characterization (NanoScience and Technology) (No. XII)
351 Contents – Volume X 27 28 29 30 31 32 33 Gecko Feet: Natural Attachment Systems for Smart Adhesion— Mechanism, Modeling, and Development of Bio-Inspired Materials Bharat Bhushan, Robert A. Sayer . . . . . . . . . 1 Carrier Transport in Advanced Semiconductor Materials Filippo Giannazzo, Patrick Fiorenza, Vito Raineri . . . . . 63 Visualization of Fixed Charges Stored in Condensed Matter and Its Application to Memory Technology Yasuo Cho .
131 Scanning Probe Microscope Application for Single Molecules in a π -Conjugated Polymer Toward Molecular Devices Based on Polymer Chemistry Ken-ichi Shinohara . . . . . . . . . . . . . 153 Scanning Probe Microscopy on Polymer Solar Cells Joachim Loos, Alexander Alexeev . . . . . . . . . 183 Scanning Probe Anodization for Nanopatterning Hiroyuki Sugimura . . . . . . . . . . . . . 217 34 Tissue Engineering: Nanoscale Contacts in Cell Adhesion to Substrates Mario D’Acunto, Paolo Giusti, Franco Maria Montevecchi, Gianluca Ciardelli .
Jarvis, John E. Sader, Takeshi Fukuma . . . . . 315 XL Contents – Volume VIII 10 Kelvin Probe Force Microscopy: Recent Advances and Applications Yossi Rosenwaks, Oren Tal, Shimon Saraf, Alex Schwarzman, Eli Lepkifker, Amir Boag . . . . . . . . . . . . 351 11 Application of Scanning Capacitance Microscopy to Analysis at the Nanoscale Štefan Lányi . . . . . . . . . . . . . . . 12 377 Probing Electrical Transport Properties at the Nanoscale by Current-Sensing Atomic Force Microscopy Laura Fumagalli, Ignacio Casuso, Giorgio Ferrari, Gabriel Gomila .